• Wafer, package and system level TLP, VF-TLP and HMM testing
• Combines TLP-8010A and TLP-4010C into one system
• Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders
• Ultra fast 50Ω high voltage pulse output with typical rise time 100 ps (0 A to 40 A) and 300 ps (>40 A)
• Up to 80 kW peak output power into 50Ω load
• Built-in HMM pulse up to ±15 kV with 100Ω-configuration
• High pulse output current up to ±80 A (short circuit) with 6 dB reflection suppression
• High speed 50Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
• 6 digital programmable pulse rise times: 100 ps to 50 ns
• 8 (optional 9) programmable pulse widths: 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width:100 ns (0 A to 80 A)
• The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 digital programmable steps (0 A to 40 A)
• Optional external pulse width extensions from 5 ns to 500 ns (0 A to 80 A) using the external pulse width extender TLP-8012A5
• Built-in pulse reflection suppression
• Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses
• Efficient software for system control and waveform data management
• The software can control automatic probers for fast measurements of complete wafers
• Industrial isolated and protected USB 2.0 interface
• High performance and high quality components
The high-current TLP/VF-TLP/HMM test system TLP-8010C combines the performance of the TLP-8010A and TLP-4010C system. It offers advanced features intended for the characterization of semiconductor devices, discrete components,such as TVS, varistors, capacitors, gas tubes, circuits and systems in the high power time domain. It includes high current I-V characteristics in pulsed operation mode, turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects e.g. reverse recovery, Safe-Operating-Area (SOA) and ESD measurements in general.
The TLP-8010C, Fig. 1, has 8 (optional 9) programmable pulse widths 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A) and 1 built-in pulse width 100 ns for currents 0 A to 80 A.
Since the TLP-8010C in the current regime up to 80 A is limited to just one single pulse width the TLP-8012A5 pulse width extender may be considered. With this optional extender additional pulse width of 5, 10, 50, 100, 200 and 500 ns for example can be generated. In contrast to the TLP-4010C the selection is done manually. Using the optional pulse width extender TLP-3011C the pulse width increases up to 1.6 µs in 68 USB programmable steps from 0 A to 40 A. The TLP-8010C can be combined and operated together with the TLP-8012A5 and TLP-3011C extenders. The system has been optimized for high frequency performance, reliability and highly flexible fast software remote control. The DUT switch shown in Fig. 1(d) automatically connects the DUT to the pulse generator or to the source meter for DC measurements.
The advanced current sensor CS-0V5-A, with 150 ps risetime, can be used up to 100 A at 500 ns pulse width.
The highly efficient TLP software offers best-in-class measurement speed with up to 5 pulses/s, depending on scope and SMU data transfer speed, with one DC spot measurement after every pulse. The software is based on the TLP-3010C/4010C platform and offers seamless control and enhanced features like 4 graphic plots with transient waveforms,DC and I-V data, as well as the I-V data in tabular form. Up to five different data sets can be loaded simultaneously for a direct comparison of devices.