Hanwa HED-W5000M

Product Summary

Low cost high performance Wafer ESD tester, from LED to system LSI large diameter Wafer, can be applied to HBM and MM discharge ESD Inadd, can judge pass/fail according to the leakage current test and can be associated with the ESD test TLP test equipment for combination test of ESD test problems occurred in the device, It can effectively obtain the working parameters of the protection circuit, and it is a high reliability device that meets the Japanese and international standards. (Meets JEITA/ESDA/JEDEC specifications)

Basic Information

Technical advantage

1.HBM waveforms are captured in real time at the wafer level

2. Meets J EDEC, ESDA, and JEITA standards

3. Use one tester to run two tests for efficiency

4. The Zap device can be installed on the probe station

5. Package-level performance can be inferred from wafer-level test results

6. Optional HMM zap test (IEC 61000-4-2)

Application

Hanwa HED-W5000M

The panel view

Hanwa HED-W5000M

Hanwa HED-W5000M

Hanwa HED-W5000M