Hanwa HED-T5000

Product Summary

This device is used to test the antistatic ability of the electrostatic protection circuit of the semiconductor components. Through the test, the characteristic parameters of the antistatic ability of the components can be clearly understood. The device developers can understand the ESD design window of the components through these parameters, so as to further improve the component protection circuit. The device can also be used to test the SOA characteristic curve of power devices by adding DC power to the GATE.

Basic Information

Technical Advantage

1. This device is equipped with the most advanced test mode

2. The incident wave of the device pin and the reflected wave emitted by the device pin can be confirmed on the oscilloscope

3, this data will be automatically saved and represented on the dedicated display software

4. The special display software can graphically depict the total value of the incident wave/reflected wave, the snapback characteristic and the current value of the leakage current test

5. The data saved ON the oscilloscope can be processed with high degrees of freedom, for example, the ON voltage of transistors of different processes and the maximum current value that can be added to the protection circuit, etc., can be overlapped by the curve to confirm the difference, and can be connected with the semi-automatic probe station to realize the automation of TLP test

6. Automatic shift between Incan pins or chips can be carried out on the Wafer level, so it can greatly improve the test efficiency

Application

1, with Inca pulse width of 100ns/200ns normal TLP test and width of 1ns VF-TLP(Very Fast TLP) test mode

2, tests that help validate the HBM/CDM pattern

Hanwa HED-T5000

Data integration analysis

Hanwa HED-T5000

Hanwa HED-T5000

Hanwa HED-T5000