Yingbo Scientific instruments (Shanghai) co. LTD
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    120 GHz Harmonic Load Pull Characteristic Characterizatio Four - Probe Method for Measure LIV Characteristic Test Schemel IV and CV Characteristic Test Semiconductor Hall Effect Test Semiconductor Discrete Device
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Yingbo Scientific instruments (Shanghai) co. LTD
158-2191-4709
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    • ESD/TLP

      Hanwa Products Hanwa HCE-5000 Hanwa HED-T5000 Hanwa HED-G5000 Hanwa HED-C5000R Hanwa HED-W5000M Hanwa HED-S5000R
    • Low temperature magnetic field probe station

      Open cycle extremely low temperature probe station Closed cycle extremely low temperature probe station Closed circulating magnetic field probe station Low temperature magnetic field probe station ICE Cryostat Magnetic field product
    • MPI probe station

      MPI manual probe station MPI semi-automatic probe station MPI fully automatic probe station MPI High Power Probe System MPI Fully Auto Die SORTER MPI Fully Automatic KGD System MPI test consumables
    • Failure analysis equipment

      Acid/laser opener Step Profiler Heat flux meter EMMI Micro-Photoluminescence Microscope Series Time-domain Failure Analysis of Advanced Packaging Hitachi Scanning Electron Microscope Transient Thermal Resistance Tester Application of Raman Spectroscopy Detection IV curve tracing tester
    • Test Instrumentation

      ROHDE&SCHWARZ Keithley Maury Keisight Primarius Farran Millimeter Wave System Wafer-level dynamic power test system Dynamic Aging HTOL Testing Machine for Compound Power Devices IWATSU Semiconductor Curve Tracer
    • OKMETIC & Wet Process Equipment

      Silicon wafer products Application area Chemical mechanical polishing machine Post-CMP cleaning machine
    • Polytec Microscopic Laser Vibrometer

      MSA-650 IRIS Microscopic Laser Vibrometer MSA-600 Microscopic Laser Vibrometer MSA-100-3D Microscopic Laser Vibrometer MSA-060 Microscopic Laser Vibrometer
    • Domestic probe & coating instrument

      Low-vacuum coating products High-vacuum coating products Domestic high-frequency 110G-500G probes
    • Heating and cooling stage

      Probe heating and cooling stage External probe heating and cooling stage Cold and hot stage for scanning electron microscope In-situ heating and cooling stage for XRD
    • Optical instruments

      3D X-ray Scanner Xray Square resistance measurement system Film thickness gauge Profiling Profilometer Optical profilometer Nanoindenter
    • Test Solutions for SiC/GaN/Si Power Devices

      CP testing equipment KGD testing equipment WLBI testing equipment Nitrogen heating system
    • Focus Microwaves

      Impedance tuner Active load-pull system Pulsed IV Test System
  • Solution
    • 120 GHz Harmonic Load Pull

    • Characteristic Characterizatio

    • Four - Probe Method for Measure

    • LIV Characteristic Test Schemel

    • IV and CV Characteristic Test

    • Semiconductor Hall Effect Test

    • Semiconductor Discrete Device

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    Existing test types: DC test, RF test,
    High voltage and high current test, photoelectric test, extremely low temperature magnetic field test, ESD/TLP test, PCB board level test, etc

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Hanwa HCE-5000

Product Summary

ESD(Electrostatic discharge) testing is performed during semiconductor reliability testing. ESD testing is essential for quality assurance both in the development of semiconductor designs and in the final production process of semiconductor manufacturing.

Basic Information

• Independent test system, small portable space occupation, high cost performance.

• With embedded operation screen, HBM, MM and leakage test can be completed independently without external PC or Curve tracer

• Suitable for power semiconductor devices and small pin IC

Technical Advantage

• Easy-to-use touch screen interface, Settings can be adjusted without a PC

• Comply with various standards and meet JEDEC/ESDA/AEC/JEITA HBM/MM requirements

• Leakage and curve tracing

Application

ESD electrostatic discharge test.

Hanwa HCE-5000

Panel View

Hanwa HCE-5000

Hanwa HCE-5000

Hanwa HCE-5000

Customer service

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    158-2191-4709 / 139-1847-4527

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Hotline:

+86 158-2191-4709(Manager lu)

After sale:

+86 139-1847-4527(Yu manager)

Address:

Lu guo building, lane 295, north songwei road, songjiang district, Shanghai

Product

  • ESD/TLP
  • Low temperature magnetic field probe station
  • MPI probe station
  • Failure analysis equipment

  

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