Hanwa Products
Hanwa HCE-5000
Hanwa HED-T5000
Hanwa HED-G5000
Hanwa HED-C5000R
Hanwa HED-W5000M
Hanwa HED-S5000R
Low temperature magnetic field probe station
Open cycle extremely low temperature probe station Closed cycle extremely low temperature probe station Closed circulating magnetic field probe station Low temperature magnetic field probe station ICE Cryostat Magnetic field product
MPI manual probe station MPI semi-automatic probe station MPI fully automatic probe station MPI High Power Probe System MPI Fully Auto Die SORTER MPI Fully Automatic KGD System MPI test consumables
Acid/laser opener Step Profiler Heat flux meter EMMI Micro-Photoluminescence Microscope Series Time-domain Failure Analysis of Advanced Packaging Hitachi Scanning Electron Microscope Transient Thermal Resistance Tester Application of Raman Spectroscopy Detection IV curve tracing tester
ROHDE&SCHWARZ Keithley Maury Keisight Primarius Farran Millimeter Wave System Wafer-level dynamic power test system Dynamic Aging HTOL Testing Machine for Compound Power Devices IWATSU Semiconductor Curve Tracer
OKMETIC & Wet Process Equipment
Silicon wafer products Application area Chemical mechanical polishing machine Post-CMP cleaning machine
Polytec Microscopic Laser Vibrometer
MSA-650 IRIS Microscopic Laser Vibrometer MSA-600 Microscopic Laser Vibrometer MSA-100-3D Microscopic Laser Vibrometer MSA-060 Microscopic Laser Vibrometer
Domestic probe & coating instrument
Low-vacuum coating products High-vacuum coating products Domestic high-frequency 110G-500G probes
Probe heating and cooling stage External probe heating and cooling stage Cold and hot stage for scanning electron microscope In-situ heating and cooling stage for XRD
3D X-ray Scanner Xray Square resistance measurement system Film thickness gauge Profiling Profilometer Optical profilometer Nanoindenter
Test Solutions for SiC/GaN/Si Power Devices
CP testing equipment KGD testing equipment WLBI testing equipment Nitrogen heating system
Impedance tuner Active load-pull system Pulsed IV Test System
Existing test types: DC test, RF test,
High voltage and high current test, photoelectric test, extremely low temperature magnetic field test, ESD/TLP test, PCB board level test, etc
+86 158-2191-4709（Manager lu）
+86 139-1847-4527（Yu manager）
Lu guo building, lane 295, north songwei road, songjiang district, Shanghai
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